Please use this identifier to cite or link to this item: https://doi.org/10.1109/VTSA.2008.4530782
DC FieldValue
dc.titleIn-situ surface passivation and metal-gate/high-k dielectric stack formation for N-channel gallium arsenide metal-oxide-semiconductor field-effect transistors
dc.contributor.authorChin, H.-C.
dc.contributor.authorZhu, M.
dc.contributor.authorWhang, S.-J.
dc.contributor.authorTung, C.-H.
dc.contributor.authorSamudra, G.S.
dc.contributor.authorYeo, Y.-C.
dc.date.accessioned2014-10-07T04:45:52Z
dc.date.available2014-10-07T04:45:52Z
dc.date.issued2008
dc.identifier.citationChin, H.-C., Zhu, M., Whang, S.-J., Tung, C.-H., Samudra, G.S., Yeo, Y.-C. (2008). In-situ surface passivation and metal-gate/high-k dielectric stack formation for N-channel gallium arsenide metal-oxide-semiconductor field-effect transistors. International Symposium on VLSI Technology, Systems, and Applications, Proceedings : 26-27. ScholarBank@NUS Repository. https://doi.org/10.1109/VTSA.2008.4530782
dc.identifier.isbn9781424416158
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83846
dc.description.abstractWe demonstrate an in-situ surface passivation technique for the formation of high-permittivity gate dielectric on GaAs using a multiple chamber metal-organic chemical vapor deposition (MOCVD) system. In-situ vacuum annealing and SiH4 treatment were performed prior to high-k dielectric deposition. This novel passivation scheme effectively suppresses the formation of Ga or As oxide during the high-k dielectric deposition process. Self-aligned GaAs MOSFETs were fabricated, showing excellent device characteristics with a peak electron mobility of 1244.4 cm2/Vs. The effect of post deposition anneal (PDA) temperature and forming gas anneal (FGA) conditions on the GaAs MOS capacitors was also investigated. Using HfAlO as gate dielectric, the in-situ surface passivated GaAs MOS capacitors demonstrate low frequency dispersion, small hysteresis and low midgap interface state density (D it) of 2.4 × 1011 to 7.5 × 1011 cm-2.eV-1, determined by high frequency conductance method. © 2008 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/VTSA.2008.4530782
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/VTSA.2008.4530782
dc.description.sourcetitleInternational Symposium on VLSI Technology, Systems, and Applications, Proceedings
dc.description.page26-27
dc.identifier.isiut000256564900011
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.