Please use this identifier to cite or link to this item: https://doi.org/10.1109/RELPHY.2007.369980
DC FieldValue
dc.titleDetermination of intrinsic spectra from frontside & backside photon emission spectroscopy
dc.contributor.authorTan, S.L.
dc.contributor.authorToh, K.H.
dc.contributor.authorChan, D.S.H.
dc.contributor.authorPhang, J.C.H.
dc.contributor.authorChua, C.M.
dc.contributor.authorKoh, L.S.
dc.date.accessioned2014-10-07T04:43:18Z
dc.date.available2014-10-07T04:43:18Z
dc.date.issued2007
dc.identifier.citationTan, S.L., Toh, K.H., Chan, D.S.H., Phang, J.C.H., Chua, C.M., Koh, L.S. (2007). Determination of intrinsic spectra from frontside & backside photon emission spectroscopy. Annual Proceedings - Reliability Physics (Symposium) : 620-621. ScholarBank@NUS Repository. https://doi.org/10.1109/RELPHY.2007.369980
dc.identifier.isbn1424409195
dc.identifier.issn00999512
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83623
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/RELPHY.2007.369980
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/RELPHY.2007.369980
dc.description.sourcetitleAnnual Proceedings - Reliability Physics (Symposium)
dc.description.page620-621
dc.description.codenARLPB
dc.identifier.isiut000246989600121
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