Please use this identifier to cite or link to this item: https://doi.org/10.1109/IECON.2011.6119667
DC FieldValue
dc.titleA multi-modal hidden Markov model based approach for continuous health assessment in machinery systems
dc.contributor.authorGeramifard, O.
dc.contributor.authorXu, J.-X.
dc.contributor.authorSicong, T.
dc.contributor.authorZhou, J.-H.
dc.contributor.authorLi, X.
dc.date.accessioned2014-10-07T04:40:31Z
dc.date.available2014-10-07T04:40:31Z
dc.date.issued2011
dc.identifier.citationGeramifard, O.,Xu, J.-X.,Sicong, T.,Zhou, J.-H.,Li, X. (2011). A multi-modal hidden Markov model based approach for continuous health assessment in machinery systems. IECON Proceedings (Industrial Electronics Conference) : 2294-2299. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IECON.2011.6119667" target="_blank">https://doi.org/10.1109/IECON.2011.6119667</a>
dc.identifier.isbn9781612849720
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83374
dc.description.abstractIn this paper 1, a multi-modal approach based on the single hidden Markov model (HMM) with continuous output is introduced for continuous health condition monitoring in machinery systems. Comparing with existing approaches such as single HMM-based approach, artificial neural networks (ANN) approach, auto-regressive moving average with exogenous inputs (ARMAX), the proposed approach improves the performance of health condition monitoring (HCM) by using multiple HMM models in parallel. Each model emphasizes on different regiments, and outputs of all models are integrated as the ultimate output. The integration of HMM outputs are conducted by either a parametric or a semi-nonparametric hindsight method. The proposed approach is applied to tool wear prediction of a CNC-milling machine, and results are compared with an existing HMM-based approach. © 2011 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IECON.2011.6119667
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/IECON.2011.6119667
dc.description.sourcetitleIECON Proceedings (Industrial Electronics Conference)
dc.description.page2294-2299
dc.description.codenIEPRE
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.