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Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.566426
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dc.title3×2 integrated microphotonic switches
dc.contributor.authorLi, B.
dc.contributor.authorChua, S.J.
dc.contributor.authorFitzgerald, E.A.
dc.contributor.authorChaudhari, B.
dc.contributor.authorJiang, S.
dc.contributor.authorCai, Z.
dc.date.accessioned2014-10-07T04:39:39Z
dc.date.available2014-10-07T04:39:39Z
dc.date.issued2005
dc.identifier.citationLi, B., Chua, S.J., Fitzgerald, E.A., Chaudhari, B., Jiang, S., Cai, Z. (2005). 3×2 integrated microphotonic switches. Proceedings of SPIE - The International Society for Optical Engineering 5625 (PART 2) : 785-792. ScholarBank@NUS Repository. https://doi.org/10.1117/12.566426
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83296
dc.description.abstractA microphotonic switch with three input waveguides and two output waveguides and integrated with an optical power splitter has been proposed. It is fabricated on the multimode interference principle in Si-based SiGe material system and configured for a 3 × 2 symmetrical structure of the three input waveguides and the two output waveguides of the device. The central waveguide section is based on a multimode interference and incorporated with an activated carrier injection element. The operating wavelengths of the device are specially designed for 1545, 1550, and 1555 nm conventional-band wavelengths. The measured crosstalk is at around -17 dB and the average insertion loss is about 2.3 dB. At switch-ON state, the measured injection current is 370 mA corresponding to an injection current density of 950 A/cm2.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.566426
dc.sourceScopus
dc.subjectIntegrated optics
dc.subjectMicrophotonic switch
dc.subjectMultimode interference
dc.subjectOptical power splitter
dc.subjectOptical waveguide
dc.subjectOptoelectronic device
dc.subjectSemiconductor materials
dc.subjectSilicon-germanium
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1117/12.566426
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume5625
dc.description.issuePART 2
dc.description.page785-792
dc.description.codenPSISD
dc.identifier.isiut000228325300096
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