Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-0233/21/2/025103
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dc.titleUsing the Monte Carlo approach to study effects of power measurement uncertainties on six-port reflectometer performance
dc.contributor.authorYao, J.J.
dc.contributor.authorYeo, S.P.
dc.date.accessioned2014-10-07T04:39:05Z
dc.date.available2014-10-07T04:39:05Z
dc.date.issued2010
dc.identifier.citationYao, J.J., Yeo, S.P. (2010). Using the Monte Carlo approach to study effects of power measurement uncertainties on six-port reflectometer performance. Measurement Science and Technology 21 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/21/2/025103
dc.identifier.issn09570233
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83253
dc.description.abstractMonte Carlo simulations have been employed to evaluate the effects of power-measurement uncertainties on the performance of six-port reflectometers (even when known to operate under less-than-optimum specifications). The numerical results compiled in the present study provide additional insights that are useful for the design of six-port reflectometers. The practical utility of the simulation software has also been demonstrated for a prototype reflectometer (implemented in microstrip form with modified branch-line couplers) which is able to yield measurement accuracies of 0.01 and 2° for the magnitude and phase, respectively, of a planar component's reflection coefficient from 4.6 GHz to 5.9 GHz. © 2010 IOP Publishing Ltd.
dc.sourceScopus
dc.subjectMicrowave reflection-coefficient measurements
dc.subjectSix-port reflectometer
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1088/0957-0233/21/2/025103
dc.description.sourcetitleMeasurement Science and Technology
dc.description.volume21
dc.description.issue2
dc.description.page-
dc.description.codenMSTCE
dc.identifier.isiut000273729300004
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