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|Title:||Using the Monte Carlo approach to study effects of power measurement uncertainties on six-port reflectometer performance||Authors:||Yao, J.J.
|Keywords:||Microwave reflection-coefficient measurements
|Issue Date:||2010||Citation:||Yao, J.J., Yeo, S.P. (2010). Using the Monte Carlo approach to study effects of power measurement uncertainties on six-port reflectometer performance. Measurement Science and Technology 21 (2) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-0233/21/2/025103||Abstract:||Monte Carlo simulations have been employed to evaluate the effects of power-measurement uncertainties on the performance of six-port reflectometers (even when known to operate under less-than-optimum specifications). The numerical results compiled in the present study provide additional insights that are useful for the design of six-port reflectometers. The practical utility of the simulation software has also been demonstrated for a prototype reflectometer (implemented in microstrip form with modified branch-line couplers) which is able to yield measurement accuracies of 0.01 and 2° for the magnitude and phase, respectively, of a planar component's reflection coefficient from 4.6 GHz to 5.9 GHz. © 2010 IOP Publishing Ltd.||Source Title:||Measurement Science and Technology||URI:||http://scholarbank.nus.edu.sg/handle/10635/83253||ISSN:||09570233||DOI:||10.1088/0957-0233/21/2/025103|
|Appears in Collections:||Staff Publications|
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