Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.tsf.2005.12.282
DC FieldValue
dc.titleTemperature dependence of Raman spectrum of GaNAs ternary alloys grown by molecular beam epitaxy
dc.contributor.authorLiu, H.F.
dc.contributor.authorXiang, N.
dc.contributor.authorTripathy, S.
dc.contributor.authorChua, S.J.
dc.date.accessioned2014-10-07T04:37:51Z
dc.date.available2014-10-07T04:37:51Z
dc.date.issued2006-10-25
dc.identifier.citationLiu, H.F., Xiang, N., Tripathy, S., Chua, S.J. (2006-10-25). Temperature dependence of Raman spectrum of GaNAs ternary alloys grown by molecular beam epitaxy. Thin Solid Films 515 (2 SPEC. ISS.) : 759-763. ScholarBank@NUS Repository. https://doi.org/10.1016/j.tsf.2005.12.282
dc.identifier.issn00406090
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/83150
dc.description.abstractRaman scattering of coherently strained GaNxAs1-x alloys grown on GaAs (001) substrates by molecular beam epitaxy has been investigated in the temperature range of 80-150 K. The intensity of GaAs-like longitudinal optical (LOGaAs) phonon and nitrogen-localized vibration mode (NLVM) decrease with temperature and the line width of both these modes show substantial broadening at higher temperatures. Temperature dependence of phonon line width and peak frequency of LOGaAs modes were analyzed in terms of anharmonic damping effect induced by thermal and compositional disorder. It is found that the anharmonicity is higher for GaNAs than that for GaAs, and increases with N concentration in GaNAs alloys. Both thermal- and disorder-induced anharmonicities can change the line width, line frequency, and lifetime of LOGaAs mode in GaNAs alloys. These results obtained from Raman investigation would lead to a better understanding of the anharmonic effects in dilute nitrides. © 2005 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.tsf.2005.12.282
dc.sourceScopus
dc.subjectAnharmonicity
dc.subjectDilute nitrides
dc.subjectRaman spectra
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1016/j.tsf.2005.12.282
dc.description.sourcetitleThin Solid Films
dc.description.volume515
dc.description.issue2 SPEC. ISS.
dc.description.page759-763
dc.description.codenTHSFA
dc.identifier.isiut000241220600092
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