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|Title:||Sub-400 °C Si2H6 passivation, HfO2 gate dielectric, and single TaN metal gate: A common gate stack technology for In0.7Ga0.3As and Ge1-xSnx CMOS||Authors:||Gong, X.
|Issue Date:||2013||Citation:||Gong, X., Han, G., Liu, B., Wang, L., Wang, W., Yang, Y., Kong, E.Y.-J., Su, S., Xue, C., Cheng, B., Yeo, Y.-C. (2013). Sub-400 °C Si2H6 passivation, HfO2 gate dielectric, and single TaN metal gate: A common gate stack technology for In0.7Ga0.3As and Ge1-xSnx CMOS. IEEE Transactions on Electron Devices 60 (5) : 1640-1648. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2013.2255057||Abstract:||We report a novel common gate-stack solution for In0.7Ga 0.3As n-channel metal-oxide-semiconductor field-effect transistors (nMOSFETs) and Ge0.97Sn0.03 p-channel metaloxide- semiconductor field-effect transistors (pMOSFETs), featuring sub-400 °C Si2H6 passivation, sub-1.75-nm capacitance equivalent thickness (CET), and single TaN metal gate. By incorporating Si 2H6 passivation, an ultrathin SiO2/Si interfacial layer is formed between the high-k gate dielectric and the high mobility InGaAs and GeSn channels. The In0.7Ga0.3As nMOSFET and Ge0.97Sn0.03 pMOSFET show drive currents of ∼143 and ∼69μA/μm, respectively, at |VDS| and |V GS - VTH| of 1V for a gate length LG of 4μm. At an inversion carrier density Ninv of 1013 cm -2, In0.7Ga0.3As nMOSFETs and Ge 0.97Sn0.03 pMOSFETs show electron and hole mobilities of ∼495 and ∼230cm2/V·s, respectively. At Ninv of 4 × 1012 cm-2, electron and hole mobility values of ∼705 and ∼ 346cm2/V·s are achieved. Symmetric VTH is realized by choosing a metal gate with midgap work function, and CET of less than 1.75nm is demonstrated with a gate-leakage current density (JG) of less than 10-4A/cm2 at a gate bias of VTH ±1V. Using this gate-stack, a Ge0.95Sn 0.05 pMOSFET with the shortest LG of 200nm is also realized. Drive current of ∼680μA/μm is achieved at VDS of -1.5V and VGS - VTH of -2V, with peak intrinsic transconductance Gm,int of ∼492μS/μm at VDS of -1.1V. © 2013 IEEE.||Source Title:||IEEE Transactions on Electron Devices||URI:||http://scholarbank.nus.edu.sg/handle/10635/83109||ISSN:||00189383||DOI:||10.1109/TED.2013.2255057|
|Appears in Collections:||Staff Publications|
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