Please use this identifier to cite or link to this item: https://doi.org/10.1007/s11664-008-0555-8
Title: Study of low-temperature thermocompression bonding in Ag-In solder for packaging applications
Authors: Made, R.I.
Gan, C.L.
Yan, L.L.
Yu, A.
Yoon, S.W.
Lau, J.H.
Lee, C. 
Keywords: IC
Indium
Low-temperature solder
MEMS
Packaging
Issue Date: Feb-2009
Citation: Made, R.I., Gan, C.L., Yan, L.L., Yu, A., Yoon, S.W., Lau, J.H., Lee, C. (2009-02). Study of low-temperature thermocompression bonding in Ag-In solder for packaging applications. Journal of Electronic Materials 38 (2) : 365-371. ScholarBank@NUS Repository. https://doi.org/10.1007/s11664-008-0555-8
Abstract: Low-temperature solders have wide applications in integrated circuits and micro-electromechanical systems packaging. In this article, a study on Ag-In solder for chip-to-chip thermocompression bonding was carried out. The resulting joint consists of AgIn 2 and Ag 9In 4 phases, with the latter phase having a melting temperature higher than 400°C. Complete consumption of In solder into a Ag-rich intermetallic compound is achieved by applying a bond pressure of 1.4 MPa at 180°C for 40 min. We also observe that the bonding pressure effect enables a Ag-rich phase to be formed within a shorter bonding duration (10 min) at a higher pressure of 1.6 MPa. Finally, prolonged aging leads to the formation of the final phase of Ag 9In 4 in the bonded joints. © 2008 TMS.
Source Title: Journal of Electronic Materials
URI: http://scholarbank.nus.edu.sg/handle/10635/83103
ISSN: 03615235
DOI: 10.1007/s11664-008-0555-8
Appears in Collections:Staff Publications

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