Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3067997
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dc.titleRaman-active Fröhlich optical phonon mode in arsenic implanted ZnO
dc.contributor.authorYe, J.D.
dc.contributor.authorTripathy, S.
dc.contributor.authorRen, F.-F.
dc.contributor.authorSun, X.W.
dc.contributor.authorLo, G.Q.
dc.contributor.authorTeo, K.L.
dc.date.accessioned2014-10-07T04:35:36Z
dc.date.available2014-10-07T04:35:36Z
dc.date.issued2009
dc.identifier.citationYe, J.D., Tripathy, S., Ren, F.-F., Sun, X.W., Lo, G.Q., Teo, K.L. (2009). Raman-active Fröhlich optical phonon mode in arsenic implanted ZnO. Applied Physics Letters 94 (1) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3067997
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82963
dc.description.abstractIn this letter, using both off-resonant and resonant Raman spectroscopic techniques, the correlation of optical phonons and structural disorder in As+ implanted ZnO single crystals has been investigated. An additional broad peak shoulder at 550 cm-1 between the transverse optical and longitudinal optical (LO) phonons was clarified to be resonant Fröhlich optical phonon mode in the framework of effective dielectric function. Under resonance condition, an asymmetric broadening and softening of the LO phonon along with a blueshifted luminescent peak revealed the decreasing phonon coherent length and nanocrystallization with increasing fluence, respectively, in good agreement with the observations of transmission electron microscopy and atomic force microscopy. © 2009 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3067997
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.3067997
dc.description.sourcetitleApplied Physics Letters
dc.description.volume94
dc.description.issue1
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000262357800031
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