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https://doi.org/10.1021/nl4041516
| Title: | Profiling nanowire thermal resistance with a spatial resolution of nanometers | Authors: | Liu, D. Xie, R. Yang, N. Li, B. Thong, J.T.L. |
Keywords: | electron beam heating nanoscale thermal transport nanostructures nanowires Thermal conductance thermal measurement |
Issue Date: | 12-Feb-2014 | Citation: | Liu, D., Xie, R., Yang, N., Li, B., Thong, J.T.L. (2014-02-12). Profiling nanowire thermal resistance with a spatial resolution of nanometers. Nano Letters 14 (2) : 806-812. ScholarBank@NUS Repository. https://doi.org/10.1021/nl4041516 | Abstract: | We report a new technique to profile the thermal resistance along a nanowire with a spatial resolution of better than 20 nm. Using this technique, we mapped the thermal conductivity along a Si0.7Ge 0.3/NiSi0.7Ge0.3 heterostructured nanowire. We also measured the interfacial thermal resistance (ITR) across the Si/NiSi 2 interface embedded in Si/NiSi2 heterostructured nanowires. The ITR does not change even for adjacent interfaces as close as ∼50 atomic layers. © 2014 American Chemical Society. | Source Title: | Nano Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/82936 | ISSN: | 15306984 | DOI: | 10.1021/nl4041516 |
| Appears in Collections: | Staff Publications |
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