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https://doi.org/10.1109/LED.2008.2000997
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dc.title | Modification of molybdenum gate electrode work function via (La-, Al-Induced) dipole effect at High-κ/SiO2 interface | |
dc.contributor.author | Lim, A.E.-J. | |
dc.contributor.author | Lee, R.T.P. | |
dc.contributor.author | Samudra, G.S. | |
dc.contributor.author | Kwong, D.-L. | |
dc.contributor.author | Yeo, Y.-C. | |
dc.date.accessioned | 2014-10-07T04:32:41Z | |
dc.date.available | 2014-10-07T04:32:41Z | |
dc.date.issued | 2008-08 | |
dc.identifier.citation | Lim, A.E.-J., Lee, R.T.P., Samudra, G.S., Kwong, D.-L., Yeo, Y.-C. (2008-08). Modification of molybdenum gate electrode work function via (La-, Al-Induced) dipole effect at High-κ/SiO2 interface. IEEE Electron Device Letters 29 (8) : 848-851. ScholarBank@NUS Repository. https://doi.org/10.1109/LED.2008.2000997 | |
dc.identifier.issn | 07413106 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82717 | |
dc.description.abstract | This letter demonstrates a way for modifying the effective work function Φm of a molybdenum (Mo) gate electrode by interface dipole engineering in a metal gate/high-κ gate stack. N-type Mo gate Φm (∼4.2 eV) was achieved on a HfLaO gate dielectric even after 950-°C rapid thermal annealing (RTA) due to the presence of a La-induced interface dipole layer. By alloying with ∼14%-19% of aluminum (Al), the effective Mo gate Φm on HfLaO significantly increased by ∼0.6 eV after 950-°C RTA. The incorporation of Al into the HfLaO gate dielectric was evident after the high-temperature anneal. The Φm modulation was attributed to Al-induced interface dipole formation, of which has opposite polarity to the La-induced dipole, at the high-κ/SiO2 interface. This novel concept of employing two opposing interface dipoles in the same metal gate/high-κ stack for Φm tunability would provide insights for future gate stack interface engineering. © 2008 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/LED.2008.2000997 | |
dc.source | Scopus | |
dc.subject | Al | |
dc.subject | Interface dipole | |
dc.subject | La | |
dc.subject | Metal gate | |
dc.subject | Mo | |
dc.subject | Work function modification | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/LED.2008.2000997 | |
dc.description.sourcetitle | IEEE Electron Device Letters | |
dc.description.volume | 29 | |
dc.description.issue | 8 | |
dc.description.page | 848-851 | |
dc.description.coden | EDLED | |
dc.identifier.isiut | 000258096000009 | |
Appears in Collections: | Staff Publications |
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