Please use this identifier to cite or link to this item:
Title: Investigation of screen-printed rear contacts for aluminum local back surface field silicon wafer solar cells
Authors: Chen, J.
Tey, Z.H.J.
Du, Z.R.
Lin, F. 
Hoex, B. 
Aberle, A.G. 
Keywords: Aluminum local back surface field (Al-LBSF)
screen-printed Al
silicon solar cells
Issue Date: 2013
Citation: Chen, J., Tey, Z.H.J., Du, Z.R., Lin, F., Hoex, B., Aberle, A.G. (2013). Investigation of screen-printed rear contacts for aluminum local back surface field silicon wafer solar cells. IEEE Journal of Photovoltaics 3 (2) : 690-696. ScholarBank@NUS Repository.
Abstract: Silicon wafer solar cells with an aluminum local back surface field (Al-LBSF) are currently intensively investigated for industrial application. One of the main challenges for the Al-LBSF solar cell is the formation of the local Al rear contacts. In our previous work, we have introduced the relative photoluminescence (PL) intensity method to study the Al-Si local contact formation. In this study, we apply this method to experimentally investigate the impact of the geometry (lines or points) of the rear contacts and compare the experimental results with theoretical results that are obtained using Fischer's model. We find that the PL intensity strongly correlates with the p+ layer thickness and inversely correlates with the void density at the rear surface. Al-LBSF solar cells with different rear contact geometries are fabricated. High Rs was found, especially for those cells with narrower line widths and a large number of voids. © 2011-2012 IEEE.
Source Title: IEEE Journal of Photovoltaics
ISSN: 21563381
DOI: 10.1109/JPHOTOV.2013.2239701
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.


checked on Feb 1, 2023


checked on Feb 1, 2023

Page view(s)

checked on Feb 2, 2023

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.