Please use this identifier to cite or link to this item: https://doi.org/10.1039/c3ra41156g
DC FieldValue
dc.titleIntegration of β-FeSi2 with poly-Si on glass for thin-film photovoltaic applications
dc.contributor.authorKumar, A.
dc.contributor.authorDalapati, G.K.
dc.contributor.authorHidayat, H.
dc.contributor.authorLaw, F.
dc.contributor.authorTan, H.R.
dc.contributor.authorWidenborg, P.I.
dc.contributor.authorHoex, B.
dc.contributor.authorTan, C.C.
dc.contributor.authorChi, D.Z.
dc.contributor.authorAberle, A.G.
dc.date.accessioned2014-10-07T04:30:43Z
dc.date.available2014-10-07T04:30:43Z
dc.date.issued2013-06-07
dc.identifier.citationKumar, A., Dalapati, G.K., Hidayat, H., Law, F., Tan, H.R., Widenborg, P.I., Hoex, B., Tan, C.C., Chi, D.Z., Aberle, A.G. (2013-06-07). Integration of β-FeSi2 with poly-Si on glass for thin-film photovoltaic applications. RSC Advances 3 (21) : 7733-7738. ScholarBank@NUS Repository. https://doi.org/10.1039/c3ra41156g
dc.identifier.issn20462069
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82552
dc.description.abstractAluminum-alloyed polycrystalline p-type β-phase iron disilicide p-β-FeSi2(Al) films with different thicknesses are successfully integrated with n-type polycrystalline silicon films on glass for thin-film solar cell applications. A sharp and high-quality interface is formed between 49 nm thick β-FeSi2(Al) and poly-Si, through the formation of a thin layer (∼7 nm) of Al-doped p+ epitaxial Si. The quality of the interface between poly-Si and p-β-FeSi2(Al) is found to degrade with increasing p-β-FeSi2(Al) thickness. An ∼5 nm thick amorphous layer is observed at the interface for the 145 nm thick p-β-FeSi2(Al) layer. The structural and photovoltaic characteristics of the p-type β-FeSi2/p+ Si/n - Si/n+ Si solar cell samples are investigated in detail. For a sample annealed at 650 °C, a one-Sun open-circuit voltage of 320 mV and pseudo fill factor of 67% are obtained, using an ∼49 nm p-type β-FeSi2 film on n-type poly-Si. The efficiency of the investigated solar cell structure decreases with increasing annealing temperature and thickness of the β-FeSi2 film. © 2013 The Royal Society of Chemistry.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1039/c3ra41156g
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentSOLAR ENERGY RESEARCH INST OF S'PORE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1039/c3ra41156g
dc.description.sourcetitleRSC Advances
dc.description.volume3
dc.description.issue21
dc.description.page7733-7738
dc.identifier.isiut000318634000016
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.