Please use this identifier to cite or link to this item:
https://doi.org/10.1021/nl071254m
DC Field | Value | |
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dc.title | Graphene thickness determination using reflection and contrast spectroscopy | |
dc.contributor.author | Ni, Z.H. | |
dc.contributor.author | Wang, H.M. | |
dc.contributor.author | Kasim, J. | |
dc.contributor.author | Fan, H.M. | |
dc.contributor.author | Yu, T. | |
dc.contributor.author | Wu, Y.H. | |
dc.contributor.author | Feng, Y.P. | |
dc.contributor.author | Shen, Z.X. | |
dc.date.accessioned | 2014-10-07T04:29:15Z | |
dc.date.available | 2014-10-07T04:29:15Z | |
dc.date.issued | 2007-09 | |
dc.identifier.citation | Ni, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X. (2007-09). Graphene thickness determination using reflection and contrast spectroscopy. Nano Letters 7 (9) : 2758-2763. ScholarBank@NUS Repository. https://doi.org/10.1021/nl071254m | |
dc.identifier.issn | 15306984 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/82426 | |
dc.description.abstract | We have clearly discriminated the single-, bilayer-, and multiple-layer graphene ( | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/nl071254m | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | PHYSICS | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1021/nl071254m | |
dc.description.sourcetitle | Nano Letters | |
dc.description.volume | 7 | |
dc.description.issue | 9 | |
dc.description.page | 2758-2763 | |
dc.identifier.isiut | 000249501900039 | |
Appears in Collections: | Staff Publications |
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