Please use this identifier to cite or link to this item: https://doi.org/10.1021/nl071254m
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dc.titleGraphene thickness determination using reflection and contrast spectroscopy
dc.contributor.authorNi, Z.H.
dc.contributor.authorWang, H.M.
dc.contributor.authorKasim, J.
dc.contributor.authorFan, H.M.
dc.contributor.authorYu, T.
dc.contributor.authorWu, Y.H.
dc.contributor.authorFeng, Y.P.
dc.contributor.authorShen, Z.X.
dc.date.accessioned2014-10-07T04:29:15Z
dc.date.available2014-10-07T04:29:15Z
dc.date.issued2007-09
dc.identifier.citationNi, Z.H., Wang, H.M., Kasim, J., Fan, H.M., Yu, T., Wu, Y.H., Feng, Y.P., Shen, Z.X. (2007-09). Graphene thickness determination using reflection and contrast spectroscopy. Nano Letters 7 (9) : 2758-2763. ScholarBank@NUS Repository. https://doi.org/10.1021/nl071254m
dc.identifier.issn15306984
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82426
dc.description.abstractWe have clearly discriminated the single-, bilayer-, and multiple-layer graphene (
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1021/nl071254m
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1021/nl071254m
dc.description.sourcetitleNano Letters
dc.description.volume7
dc.description.issue9
dc.description.page2758-2763
dc.identifier.isiut000249501900039
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