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Title: Frequency-thermal characterization of on-chip transformers with patterned ground shields
Authors: Shi, J.
Yin, W.-Y.
Kang, K.
Mao, J.-F.
Li, L.-W. 
Keywords: Interleaved and center-tapped transformers
Maximum available gain
Minimum noise figure
Pattern ground shields (PGSs)
Power loss
Quality (Q) factor
Issue Date: Jan-2007
Citation: Shi, J., Yin, W.-Y., Kang, K., Mao, J.-F., Li, L.-W. (2007-01). Frequency-thermal characterization of on-chip transformers with patterned ground shields. IEEE Transactions on Microwave Theory and Techniques 55 (1) : 1-11. ScholarBank@NUS Repository.
Abstract: Extensive studies on the performance of on-chip CMOS transformers with and without patterned ground shields (PGSs) at different temperatures are carried out in this paper. These transformers are fabricated using 0.18-μm RF CMOS processes and are designed to have either interleaved or center-tapped interleaved geometries, respectively, but with the same inner dimensions, metal track widths, track spacings, and silicon substrate. Based on the two-port S-parameters measured at different temperatures, all performance parameters of these transformers, such as frequency- and temperature-dependent maximum available gain (Gmax), minimum noise figure (NFmin), quality factor (Q1) of the primary or secondary coil, and power loss (Ploss) are characterized and compared. It is found that: 1) the values of the Gmax and Q1 factor usually decrease with the temperature; however, there may be reverse temperature effects on both G max and Q1 factor beyond certain frequency; 2) with the same geometric parameters, interleaved transformers exhibit better low-frequency performance than center-tapped interleaved transformers, whereas the center-tapped configurations possess lower values of NFmin at higher frequencies; and 3) with temperature rising, the degradation in performance of the interleaved transformers can be effectively compensated by the implementation of a PGS, while for center-tapped geometry, the shielding effectiveness of PGS on the performance improvement is ineffective. © 2006 IEEE.
Source Title: IEEE Transactions on Microwave Theory and Techniques
ISSN: 00189480
DOI: 10.1109/TMTT.2006.888934
Appears in Collections:Staff Publications

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