Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1447523
DC FieldValue
dc.titleFerromagnetic nano-dot array fabricated by electron beam radiation induced nano-scale phase transition
dc.contributor.authorZhou, T.J.
dc.contributor.authorZhao, Y.
dc.contributor.authorWang, J.P.
dc.contributor.authorThong, J.T.L.
dc.contributor.authorChong, T.C.
dc.date.accessioned2014-10-07T04:28:24Z
dc.date.available2014-10-07T04:28:24Z
dc.date.issued2002-05-15
dc.identifier.citationZhou, T.J., Zhao, Y., Wang, J.P., Thong, J.T.L., Chong, T.C. (2002-05-15). Ferromagnetic nano-dot array fabricated by electron beam radiation induced nano-scale phase transition. Journal of Applied Physics 91 (10 I) : 6854-6856. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1447523
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82356
dc.description.abstractWe present a method of direct magnetic patterning of a nonmagnetic Co-C amorphous film by electron beam radiation induced nano-scale phase transition. Co-C alloy films with C concentration from 30 to 50 at% and thickness of 30-60 nm were prepared by alternately sputtering Co and C films onto C-buffered glass substrates. The films are amorphous and nonmagnetic with C concentration up to 40 at%. Due to their negative mixture entropy, as-deposited amorphous Co-C alloy films are metastable. Focused electron-beam irradiation causes localized phase segregation of the immiscible magnetic (Co-rich) and nonmagnetic (C-rich) phases. Ferromagnetic Co(C) nano-dot array was fabricated by subjecting the as-deposited Co 60C 40 films to electron beam radiation using a beam current of 16 nA, a beam energy of 20 keV and a dwell time of 5 s per dot. Magnetic force microscopy images and magnetic measurements confirm the formation of the ferromagnetic phase. The present single-step nanolithography eliminates the cumbersome traditional processes and is potentially a new and flexible alternative for fabricating patterned magnetic nanostructures for submicron magnetic devices. © 2002 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1447523
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.1447523
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume91
dc.description.issue10 I
dc.description.page6854-6856
dc.description.codenJAPIA
dc.identifier.isiut000175575100017
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.