Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4768932
DC FieldValue
dc.titleEvolution of variable range hopping in strongly localized two dimensional electron gas at NdAlO3/SrTiO3 (100) heterointerfaces
dc.contributor.authorAnnadi, A.
dc.contributor.authorPutra, A.
dc.contributor.authorSrivastava, A.
dc.contributor.authorWang, X.
dc.contributor.authorHuang, Z.
dc.contributor.authorLiu, Z.Q.
dc.contributor.authorVenkatesan, T.
dc.contributor.authorAriando
dc.date.accessioned2014-10-07T04:27:51Z
dc.date.available2014-10-07T04:27:51Z
dc.date.issued2012-12-03
dc.identifier.citationAnnadi, A., Putra, A., Srivastava, A., Wang, X., Huang, Z., Liu, Z.Q., Venkatesan, T., Ariando (2012-12-03). Evolution of variable range hopping in strongly localized two dimensional electron gas at NdAlO3/SrTiO3 (100) heterointerfaces. Applied Physics Letters 101 (23) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4768932
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/82309
dc.description.abstractWe report evolution of the two-dimensional electron gas behavior at the NdAlO3/SrTiO3 heterointerfaces with varying thicknesses of the NdAlO3 overlayer. The samples with a thicker NdAlO3 show strong localizations at low temperatures and the degree of localization is found to increase with the NdAlO3 thickness. The T-1/3 temperature dependence of the sheet resistance at low temperatures and the magnetoresistance study reveal that the conduction is governed by a two-dimensional variable range hopping mechanism in this strong localized regime. We attribute this thickness dependence of the transport properties of the NdAlO3/SrTiO3 interfaces to the interface strain induced by the overlayers. © 2012 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4768932
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentDEAN'S OFFICE (ENGINEERING)
dc.contributor.departmentPHYSICS
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.4768932
dc.description.sourcetitleApplied Physics Letters
dc.description.volume101
dc.description.issue23
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000312243900016
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

11
checked on Aug 14, 2020

WEB OF SCIENCETM
Citations

14
checked on Aug 7, 2020

Page view(s)

105
checked on Aug 2, 2020

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.