Please use this identifier to cite or link to this item: https://doi.org/10.1088/0957-4484/25/22/225203
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dc.titleA facile approach for screening isolated nanomagnetic behavior for bit-patterned media
dc.contributor.authorThiyagarajah, N.
dc.contributor.authorAsbahi, M.
dc.contributor.authorWong, R.T.J.
dc.contributor.authorLow, K.W.M.
dc.contributor.authorYakovlev, N.L.
dc.contributor.authorYang, J.K.W.
dc.contributor.authorNg, V.
dc.date.accessioned2014-10-07T04:22:37Z
dc.date.available2014-10-07T04:22:37Z
dc.date.issued2014-06-06
dc.identifier.citationThiyagarajah, N., Asbahi, M., Wong, R.T.J., Low, K.W.M., Yakovlev, N.L., Yang, J.K.W., Ng, V. (2014-06-06). A facile approach for screening isolated nanomagnetic behavior for bit-patterned media. Nanotechnology 25 (22) : -. ScholarBank@NUS Repository. https://doi.org/10.1088/0957-4484/25/22/225203
dc.identifier.issn13616528
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/81866
dc.description.abstractBit-patterned media (BPM) fabricated by the direct deposition of magnetic material onto prepatterned arrays of nanopillars is a promising approach for increasing magnetic recording of areal density. One of the key challenges of this approach is to identify and control the magnetic interaction between the bits (on top of the nanopillars) and the trench material between the pillars. Using independent techniques, including magnetic force microscopy, the variable-angle magneto-optic Kerr effect, and remanence curves, we were able to determine the presence and relative intensities of exchange and dipolar interactions in Co-Pd multilayer-based BPM fabricated by direct deposition. We found that for pitches of 30 nm or less, there were negligible exchange interactions, and the bits were found to be magnetically isolated. As we move to higher densities, the absence of exchange interactions indicates that direct deposition is a promising approach to BPM fabrication. © 2014 IOP Publishing Ltd.
dc.sourceScopus
dc.subjectbit pattern media
dc.subjectexchange interaction
dc.subjectmagnetic force microscopy
dc.subjectmagneto-optical Kerr effect
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1088/0957-4484/25/22/225203
dc.description.sourcetitleNanotechnology
dc.description.volume25
dc.description.issue22
dc.description.page-
dc.description.codenNNOTE
dc.identifier.isiut000336728400004
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