Please use this identifier to cite or link to this item: https://doi.org/10.1364/OE.20.020102
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dc.titleA complex-weighted, decision-aided, maximum-likelihood carrier phase and frequency-offset estimation algorithm for coherent optical detection
dc.contributor.authorMeiyappan, A.
dc.contributor.authorKam, P.-Y.
dc.contributor.authorKim, H.
dc.date.accessioned2014-10-07T04:22:26Z
dc.date.available2014-10-07T04:22:26Z
dc.date.issued2012-08-27
dc.identifier.citationMeiyappan, A., Kam, P.-Y., Kim, H. (2012-08-27). A complex-weighted, decision-aided, maximum-likelihood carrier phase and frequency-offset estimation algorithm for coherent optical detection. Optics Express 20 (18) : 20102-20114. ScholarBank@NUS Repository. https://doi.org/10.1364/OE.20.020102
dc.identifier.issn10944087
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/81851
dc.description.abstractWe present a symbol-by-symbol coherent optical receiver, which employs a novel, complex-weighted, decision-aided, maximum-likelihood (CW-DA-ML) carrier phase and frequency offset estimator. The CW-DA-ML carrier estimator uses a CW transversal filter to generate a carrier reference phasor, and the filter weights are automatically adapted on-line by linear regression on the observed signals. A complete modulo-R reduced frequency offset estimation (FOE) range of ± R/2 is achieved, independent of modulation format, where R is the symbol rate. Carrier phase and frequency tracking is achieved rapidly. The acquisition speed of frequency offset in quaternary phase-shift keying (4-PSK) signals is more than 5 times faster than that of differential FOE. A constant penalty of approximately 1 dB at bit-error rate of 10-4 is demonstrated for all frequency offsets in 4-PSK signals with laser-linewidth-symbol-duration product of 8 × 10-5 . © 2012 Optical Society of America.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1364/OE.20.020102
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1364/OE.20.020102
dc.description.sourcetitleOptics Express
dc.description.volume20
dc.description.issue18
dc.description.page20102-20114
dc.identifier.isiut000308414800051
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