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|Title:||Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors||Authors:||Yeo, S.P.
|Issue Date:||1998||Citation:||Yeo, S.P.,Tay, S.T. (1998). Improved technique for measuring complex reflection coefficients of microwave devices using only two power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 634-637. ScholarBank@NUS Repository.||Abstract:||The paper describes an improved technique for measuring the complex reflection coefficients of microwave devices using the four-port multi-state reflectometer (which requires two power detectors and other commonly-available laboratory components). Simulation and experimental tests have confirmed that the prototype instrument (implemented in waveguide form) is able to yield measurement accuracies of within ±0.01 for magnitude and ±1 ° for phase.||Source Title:||Conference Record - IEEE Instrumentation and Measurement Technology Conference||URI:||http://scholarbank.nus.edu.sg/handle/10635/81477|
|Appears in Collections:||Staff Publications|
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