Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.908402
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dc.titleEffect of orientation ratio on recording performance for longitudinal thin film media
dc.contributor.authorHee, C.H.
dc.contributor.authorWang, J.P.
dc.contributor.authorGong, H.
dc.contributor.authorLow, T.S.
dc.date.accessioned2014-10-07T03:07:56Z
dc.date.available2014-10-07T03:07:56Z
dc.date.issued2000-09
dc.identifier.citationHee, C.H.,Wang, J.P.,Gong, H.,Low, T.S. (2000-09). Effect of orientation ratio on recording performance for longitudinal thin film media. IEEE Transactions on Magnetics 36 (5 I) : 2291-2293. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/20.908402" target="_blank">https://doi.org/10.1109/20.908402</a>
dc.identifier.issn00189464
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/81403
dc.description.abstractThe effects of orientation ratio (OR) on longitudinal thin film media recording performance are studied via micromagnetic modeling. The OR of the media is controlled by the anisotropy axes distribution. Along the preferred anisotropy direction, the coercivity and the remanence increases with decreasing standard deviation of anisotropy distribution σ and gives rise to an OR as high as 90. Highly oriented media show an ultra low transition noise and high effective track width. However, it is observed that highly oriented media exhibits a large track edge bending which increases the track edge noise. Effect of saturation magnetization (Ms) on the recording pattern for highly oriented media (OR = 22.5) is investigated. Low magnetization is found to induce even lower transition noise and slightly higher effective track width. Edge percolation is observed when Ms increases up to 800 emu/cm3. However, the noise magnitude at this edge does not change much when Ms is decreased to 200 emu/cm3.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/20.908402
dc.sourceScopus
dc.subjectEdge noise
dc.subjectEffective track width
dc.subjectHighly oriented media
dc.subjectTransition noise
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.departmentMATERIALS SCIENCE
dc.description.doi10.1109/20.908402
dc.description.sourcetitleIEEE Transactions on Magnetics
dc.description.volume36
dc.description.issue5 I
dc.description.page2291-2293
dc.description.codenIEMGA
dc.identifier.isiutNOT_IN_WOS
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