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|Title:||Spreading resistance calculations for graded structures based on the uniform flux source boundary condition||Authors:||Leong, M.S.
|Issue Date:||Mar-1977||Citation:||Leong, M.S.,Choo, S.C.,Wang, C.C. (1977-03). Spreading resistance calculations for graded structures based on the uniform flux source boundary condition. Solid State Electronics 20 (3) : 255-264. ScholarBank@NUS Repository.||Abstract:||In the approximate calculations of spreading resistance correction factors, two different types of boundary conditions over the source region have hitherto been assumed, viz., a uniform flux distribution, and the specific flux distribution that obtains in the classical solution for the infinitely thick slab. This paper presents results of a theory which has been derived for multilayer structures by using the uniform source flux distribution. The results given include those obtained for a series of exponentially-graded structures of varying steepness in the resistivity profile, whose thickness h1 ranges from 0.1 to 10 times the circular source contact radius, a. The results show that, as a rule, for an insulating substrate and (h′1/a) < 0.5, the uniform flux assumption leads to correction factors which differ at most by about 3% from those derived from the infinitely-thick slab flux assumption, while for a conducting substrate and (h′1/a) = 0.1 to 10, there is a difference of about 8%. Whatever the nature of the resistivity profile studied, it has been found that the difference is never greater than about 8%. © 1977.||Source Title:||Solid State Electronics||URI:||http://scholarbank.nus.edu.sg/handle/10635/81216||ISSN:||00381101|
|Appears in Collections:||Staff Publications|
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