Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/80998
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dc.titlePortable scanning electron microscope designs
dc.contributor.authorKhursheed, A.
dc.date.accessioned2014-10-07T03:03:33Z
dc.date.available2014-10-07T03:03:33Z
dc.date.issued1998
dc.identifier.citationKhursheed, A. (1998). Portable scanning electron microscope designs. Journal of Electron Microscopy 47 (6) : 591-602. ScholarBank@NUS Repository.
dc.identifier.issn00220744
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/80998
dc.description.abstractFurther analysis and simulation of the portable scanning electron microscope proposal based upon the use of permanent magnets is presented. The interaction between the condenser and objective lenses as well as their coupling to different specimen chambers is taken into account. The proposal is also generalised to apply to miniature SEMs as well as to portable SEM columns and can incorporate magnetic screening. In addition, Hall probe measurements were made for the axial field distribution near the pole tip of a test objective lens, and was found to differ from the simulation predictions by less than 5%.
dc.sourceScopus
dc.subjectLens design
dc.subjectMagnetic screening
dc.subjectPole-piece
dc.subjectPortable SEM
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleJournal of Electron Microscopy
dc.description.volume47
dc.description.issue6
dc.description.page591-602
dc.description.codenJELJA
dc.identifier.isiutNOT_IN_WOS
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