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Please use this identifier to cite or link to this item: https://doi.org/10.1049/el:19950227
DC FieldValue
dc.titlePerformance of BPSK with open-loop tanlock carrier recovery
dc.contributor.authorKam, P.Y.
dc.date.accessioned2014-10-07T03:03:09Z
dc.date.available2014-10-07T03:03:09Z
dc.date.issued1995-03-02
dc.identifier.citationKam, P.Y. (1995-03-02). Performance of BPSK with open-loop tanlock carrier recovery. Electronics Letters 31 (5) : 349-350. ScholarBank@NUS Repository. https://doi.org/10.1049/el:19950227
dc.identifier.issn00135194
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/80961
dc.description.abstractThe operational and performance advantages of a recently proposed open-loop tanlock carrier recovery structure for BPSK over conventional closed-loop structures are pointed out. Error rate results for the former, obtained via computer simulations over the Rician fading channel and the random phase channel, are presented to show its performance characteristics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1049/el:19950227
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.doi10.1049/el:19950227
dc.description.sourcetitleElectronics Letters
dc.description.volume31
dc.description.issue5
dc.description.page349-350
dc.description.codenELLEA
dc.identifier.isiutA1995QP00700012
Appears in Collections:Staff Publications

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