Please use this identifier to cite or link to this item: https://doi.org/10.1049/el:19950362
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dc.titleOutage probability for a Rician signal in L Rician interferers
dc.contributor.authorTjhung, T.T.
dc.contributor.authorChai, C.C.
dc.contributor.authorDong, X.
dc.date.accessioned2014-10-07T03:02:47Z
dc.date.available2014-10-07T03:02:47Z
dc.date.issued1995-01-01
dc.identifier.citationTjhung, T.T., Chai, C.C., Dong, X. (1995-01-01). Outage probability for a Rician signal in L Rician interferers. Electronics Letters 31 (7) : 532-533. ScholarBank@NUS Repository. https://doi.org/10.1049/el:19950362
dc.identifier.issn00135194
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/80925
dc.description.abstractA new general outage probability expression for a Rician signal received among L Rician interferers is derived. This result is shown to cover previously published expressions involving Rayleigh signal/interferers as special cases. New Rician/Rician outage probability curves are presented and discussed.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1049/el:19950362
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.doi10.1049/el:19950362
dc.description.sourcetitleElectronics Letters
dc.description.volume31
dc.description.issue7
dc.description.page532-533
dc.description.codenELLEA
dc.identifier.isiutA1995QT82300017
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