Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices

Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/80573

DC Field	Value
dc.title	Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices
dc.contributor.author	Yeo, S.P.
dc.contributor.author	Cheng, M.
dc.date.accessioned	2014-10-07T02:59:00Z
dc.date.available	2014-10-07T02:59:00Z
dc.date.issued	1996-03-14
dc.identifier.citation	Yeo, S.P.,Cheng, M. (1996-03-14). Improved four-port instrument using two power detectors to measure complex reflection coefficients of microwave devices. Electronics Letters 32 (6) : 565-566. ScholarBank@NUS Repository.
dc.identifier.issn	00135194
dc.identifier.uri	http://scholarbank.nus.edu.sg/handle/10635/80573
dc.description.abstract	An improved prototype of the multi-state four port reflectometer (which uses only two power detectors) is used for measuring the complex reflection coefficients of microwave devices. Laboratory tests indicate that the measurement uncertainties for the proposed instrument are within ±0.01 for magnitude and ±1.5° for phase.
dc.source	Scopus
dc.subject	Microwave measurement
dc.subject	Reflectometers
dc.type	Article
dc.contributor.department	MECHANICAL & PRODUCTION ENGINEERING
dc.contributor.department	ELECTRICAL ENGINEERING
dc.description.sourcetitle	Electronics Letters
dc.description.volume	32
dc.description.issue	6
dc.description.page	565-566
dc.description.coden	ELLEA
dc.identifier.isiut	NOT_IN_WOS
Appears in Collections:	Staff Publications

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