Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/80546
DC Field | Value | |
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dc.title | Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate | |
dc.contributor.author | Lou, C.L. | |
dc.contributor.author | Chim, W.K. | |
dc.contributor.author | Chan, D.S.H. | |
dc.contributor.author | Pan, Y. | |
dc.date.accessioned | 2014-10-07T02:58:43Z | |
dc.date.available | 2014-10-07T02:58:43Z | |
dc.date.issued | 1996-11 | |
dc.identifier.citation | Lou, C.L.,Chim, W.K.,Chan, D.S.H.,Pan, Y. (1996-11). Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gate. Microelectronics Reliability 36 (11-12 SPEC. ISS.) : 1663-1666. ScholarBank@NUS Repository. | |
dc.identifier.issn | 00262714 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/80546 | |
dc.description.abstract | Under maximum substrate current (Isub,max) stress, tungsten-polycide gate (WSix) n-MOSFETs are more resistant to hot-carrier degradation than polysilicon gate (PolySi) devices. However, under maximum gate current (Ig,max) stress, WSix n-MOSFETs degrade more severely. WSix p-MOSFETs degrade more than the PolySi p-MOSFETs under both the Isub,max and Ig,max stress. An explanation substantiated by the charge-pumping measurements is proposed. The hot-carrier lifetimes of WSix n-MOSFETs are found to be higher than that of the WSix p-MOSFETs. Copyright © 1996 Elsevier Science Ltd. | |
dc.source | Scopus | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL ENGINEERING | |
dc.description.sourcetitle | Microelectronics Reliability | |
dc.description.volume | 36 | |
dc.description.issue | 11-12 SPEC. ISS. | |
dc.description.page | 1663-1666 | |
dc.description.coden | MCRLA | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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