Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/80530
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dc.titleHigh resolution lens attachment for SEMs
dc.contributor.authorKhursheed, A.
dc.contributor.authorKaruppiah, N.
dc.contributor.authorKoh, S.H.
dc.date.accessioned2014-10-07T02:58:33Z
dc.date.available2014-10-07T02:58:33Z
dc.date.issued2000-03
dc.identifier.citationKhursheed, A.,Karuppiah, N.,Koh, S.H. (2000-03). High resolution lens attachment for SEMs. Scanning 22 (2) : 113-114. ScholarBank@NUS Repository.
dc.identifier.issn01610457
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/80530
dc.description.abstractA new compact add-on objective lens for the scanning electron microscope (SEM) was designed and tested. In particular, Hall probe measurements of the lens were made. Overall, the results provide confirmation that the high resolution add-on objective lens is feasible.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleScanning
dc.description.volume22
dc.description.issue2
dc.description.page113-114
dc.description.codenSCNND
dc.identifier.isiutNOT_IN_WOS
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