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|Title:||High resolution lens attachment for SEMs||Authors:||Khursheed, A.
|Issue Date:||Mar-2000||Citation:||Khursheed, A.,Karuppiah, N.,Koh, S.H. (2000-03). High resolution lens attachment for SEMs. Scanning 22 (2) : 113-114. ScholarBank@NUS Repository.||Abstract:||A new compact add-on objective lens for the scanning electron microscope (SEM) was designed and tested. In particular, Hall probe measurements of the lens were made. Overall, the results provide confirmation that the high resolution add-on objective lens is feasible.||Source Title:||Scanning||URI:||http://scholarbank.nus.edu.sg/handle/10635/80530||ISSN:||01610457|
|Appears in Collections:||Staff Publications|
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