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|Title:||Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures||Authors:||Ling, C.H.
|Issue Date:||Sep-1986||Citation:||Ling, C.H.,Kwok, C.Y.,Chan, E.G.,Tay, T.M. (1986-09). Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures. Solid State Electronics 29 (9) : 995-997. ScholarBank@NUS Repository.||Source Title:||Solid State Electronics||URI:||http://scholarbank.nus.edu.sg/handle/10635/80454||ISSN:||00381101|
|Appears in Collections:||Staff Publications|
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