Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/80454
Title: Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures
Authors: Ling, C.H. 
Kwok, C.Y.
Chan, E.G.
Tay, T.M.
Issue Date: Sep-1986
Citation: Ling, C.H.,Kwok, C.Y.,Chan, E.G.,Tay, T.M. (1986-09). Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures. Solid State Electronics 29 (9) : 995-997. ScholarBank@NUS Repository.
Source Title: Solid State Electronics
URI: http://scholarbank.nus.edu.sg/handle/10635/80454
ISSN: 00381101
Appears in Collections:Staff Publications

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