Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/80289
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dc.titleAn analytical model for Type I magnetic contrast enhancement with sample tilting
dc.contributor.authorChim, W.K.
dc.date.accessioned2014-10-07T02:55:53Z
dc.date.available2014-10-07T02:55:53Z
dc.date.issued1997-11-01
dc.identifier.citationChim, W.K. (1997-11-01). An analytical model for Type I magnetic contrast enhancement with sample tilting. Journal of Applied Physics 82 (9) : 4143-4147. ScholarBank@NUS Repository.
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/80289
dc.description.abstractIn this article, an analytical model for Type I magnetic contrast enhancement in the scanning electron microscope, achieved by sample tilting, is presented. The model accounts for the energy filtering of the secondary electrons emitted from the sample. The results showed that the optimum sample tilt angle for maximum contrast is a function of the field-distance integral. For small field-distance integrals less than 10-7 Tm, corresponding to a weak magnetic field situation, the optimum sample tilt is close to 0°. For large field-distance integrals, the optimum sample tilt angle increases and approaches 45° for a field-distance integral of 8×10-6 Tm. © 1997 American Institute of Physics.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume82
dc.description.issue9
dc.description.page4143-4147
dc.description.codenJAPIA
dc.identifier.isiutNOT_IN_WOS
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