Please use this identifier to cite or link to this item:
|Title:||Feasibility of modulated optical deflection sensing in atomic force microscopy||Authors:||Ng, T.W.
|Keywords:||Atomic force microscopy
|Issue Date:||2005||Citation:||Ng, T.W., Lee, W.S., Sasaki, O. (2005). Feasibility of modulated optical deflection sensing in atomic force microscopy. Proceedings of SPIE - The International Society for Optical Engineering 5852 PART II : 621-626. ScholarBank@NUS Repository. https://doi.org/10.1117/12.621749||Abstract:||Optical deflection sensing is perhaps the most widely used scheme in atomic force microscopy. In this technique, the sensor is a quadrant photodiode. Position detection is essentially achieved using voltage differencing between the photodiode outputs. To improve data throughput, this is often done using operational amplifiers in the differencing mode. The measurement sensitivity is affected by environmental noise. Intensity modulation is a simple method of overcoming environmental noise. When this scheme is applied to the optical deflection sensor technique, random chaotic signals were found to form. Unless expensive filtering methods are introduced, the efficacy of using intensity modulation to reduce the effects of environmental noise in the optical deflection sensing method is limited.||Source Title:||Proceedings of SPIE - The International Society for Optical Engineering||URI:||http://scholarbank.nus.edu.sg/handle/10635/75281||ISSN:||0277786X||DOI:||10.1117/12.621749|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 1, 2021
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.