Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/75067
DC FieldValue
dc.titlePrecision phase measurement in digital speckle shearing interferometry
dc.contributor.authorShu, Y.
dc.contributor.authorChau, Fook S.
dc.contributor.authorToh, Siew-Lok
dc.date.accessioned2014-06-19T09:10:32Z
dc.date.available2014-06-19T09:10:32Z
dc.date.issued1997
dc.identifier.citationShu, Y., Chau, Fook S., Toh, Siew-Lok (1997). Precision phase measurement in digital speckle shearing interferometry. Proceedings of SPIE - The International Society for Optical Engineering 2921 : 655-661. ScholarBank@NUS Repository.
dc.identifier.isbn0819423238
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/75067
dc.description.abstractThe measurement of phase in Digital Shearing Speckle Interferometry (DSSI) is a challenging problem because of the inherently noisy nature of shearing speckle interferograms. Accurate phase measurement depends on having a high-precision imaging system, a finely-controlled phase-shifting technique ans good algorithms. In this paper, two selected algorithms used for carrying out phase measurement in ESPI (Electronic Speckle Pattern Interferometry) are applied to phase measurement in DSSI. The components and requirements of the high-precision imaging system developed to improve the recording quality of shearing interferograms are discussed. A new precisely-controlled phase shifting method developed to reduce systematic measurement error is also described. Experimental results are presented to illustrate the method.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentMECHANICAL & PRODUCTION ENGINEERING
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume2921
dc.description.page655-661
dc.description.codenPSISD
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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