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|Title:||Performance of charge-coupled devices in digital shearography||Authors:||Ng, Tuck-Wah
Chau, Fook S.
|Issue Date:||1993||Citation:||Ng, Tuck-Wah,Chau, Fook S. (1993). Performance of charge-coupled devices in digital shearography. Proceedings of SPIE - The International Society for Optical Engineering 2066 : 14-19. ScholarBank@NUS Repository.||Abstract:||The use of charge-coupled devices (CCDs) for imaging in digital shearography necessitates the knowledge of their electronic (signal-independent) noise level, as the visibility of fringes produced is dependent on this factor. A method based on measuring the experimental CCD noise variance to construct a linear equation system is presented. From the solution of this equation system, the electronic noise level of a particular CCD used for imaging can be determined. Evaluation of CCDs based on this noise factor allows the performance of each CCD used in digital shearography to be compared.||Source Title:||Proceedings of SPIE - The International Society for Optical Engineering||URI:||http://scholarbank.nus.edu.sg/handle/10635/75064||ISBN:||0819413313||ISSN:||0277786X|
|Appears in Collections:||Staff Publications|
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