Please use this identifier to cite or link to this item:
Title: Defect measurement using structured light system
Authors: Toh, Siew-Lok 
Low, W.K.
Tay, C.J. 
Shang, H.M. 
Asundi, Anand K. 
Issue Date: 1997
Citation: Toh, Siew-Lok,Low, W.K.,Tay, C.J.,Shang, H.M.,Asundi, Anand K. (1997). Defect measurement using structured light system. Proceedings of SPIE - The International Society for Optical Engineering 2921 : 529-534. ScholarBank@NUS Repository.
Abstract: In this paper, a new digital speckle intensity correlation searching technique which is named as 'differential oriented search' is proposed. This method effectively makes use of the distribution characteristics of the correlation functions, which makes the calculating time be considerably reduced. Experimental results shows that, the method presented here is a kind of high speed, high accurate and practical correlation metrology.
Source Title: Proceedings of SPIE - The International Society for Optical Engineering
ISBN: 0819423238
ISSN: 0277786X
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

checked on Nov 18, 2021

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.