Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/74784
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dc.titleThe investigation of light outcoupling in blue top-emitting OLEDs
dc.contributor.authorDeng, L.-L.
dc.contributor.authorChen, S.-F.
dc.contributor.authorWei, H.
dc.contributor.authorBin, L.
dc.date.accessioned2014-06-19T06:16:24Z
dc.date.available2014-06-19T06:16:24Z
dc.date.issued2010
dc.identifier.citationDeng, L.-L., Chen, S.-F., Wei, H., Bin, L. (2010). The investigation of light outcoupling in blue top-emitting OLEDs. Proceedings of SPIE - The International Society for Optical Engineering 7852 : -. ScholarBank@NUS Repository.
dc.identifier.isbn9780819483829
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/74784
dc.description.abstractA classic electromagnetic theory is used in this paper to investigate the light outcoupling in blue top-emitting organic light-emitting devices (TEOLEDs) with a samarium/silver (Sm/Ag) bilayer cathode. With the method, the outcoupling efficiency and the spectra of the devices with different top-electrodes and outcoupling layers were simulated. The calculated results demonstrate that in the devices, the increasing thickness of the Ag film would result in the redshift of blue emission and the decrease of emission intensity. While the thickness of the Sm film only influences the emission intensity of the devices. The thickness of the outcoupling layer is varied to obtain the saturated and efficient blue emission and then the optimal thickness is determined. The microcavity effect induced mainly by the bilayer cathode with a relatively high reflectivity is considered to explain the optical characteristics of the blue TEOLEDs, including some abnormal phenomena. The simulated results show good agreement with the measured data. © 2010 SPIE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.869974
dc.sourceScopus
dc.subjectBlue emission
dc.subjectEfficiency
dc.subjectElectromagnetic theory
dc.subjectInterference
dc.subjectMicrocavity effect
dc.subjectOutcoupling
dc.subjectSimulation
dc.subjectTEOLED
dc.typeConference Paper
dc.contributor.departmentCHEMICAL & BIOMOLECULAR ENGINEERING
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume7852
dc.description.page-
dc.description.codenPSISD
dc.identifier.isiut000287707000025
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