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|Title:||Defect engineering in self-assembled 3D photonic crystals||Authors:||Yan, Q.
|Issue Date:||2007||Citation:||Yan, Q.,Zhou, Z.,Su, F.,Zhao, X.S. (2007). Defect engineering in self-assembled 3D photonic crystals. Diffusion and Defect Data Pt.B: Solid State Phenomena 121-123 (PART 1) : 57-60. ScholarBank@NUS Repository.||Abstract:||This work describes the combination of photolithography and self-assembly methods for fabrication of 3D photonic crystals (PCs) with well-defined micron-scale line defects embedded in the PCs. Line defects with different dimensions, shapes, and compositions have been introduced into the 3D PCs by choosing different photoresists, masks, and template-directed assembly techniques. Infiltration of carbon using high-temperature chemical vapor deposition (CVD) technique showed that the fabrication procedure offers an ideal approach to functional 3D photonic devices from self-assembled photonic crystals.||Source Title:||Diffusion and Defect Data Pt.B: Solid State Phenomena||URI:||http://scholarbank.nus.edu.sg/handle/10635/74538||ISBN:||3908451302||ISSN:||10120394|
|Appears in Collections:||Staff Publications|
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