Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.774082
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dc.titleStructural damage assessment using damage locating vector with limited sensors
dc.contributor.authorTran, V.A.
dc.contributor.authorDuan, W.H.
dc.contributor.authorQuek, S.T.
dc.date.accessioned2014-06-19T05:52:11Z
dc.date.available2014-06-19T05:52:11Z
dc.date.issued2008
dc.identifier.citationTran, V.A., Duan, W.H., Quek, S.T. (2008). Structural damage assessment using damage locating vector with limited sensors. Proceedings of SPIE - The International Society for Optical Engineering 6932 : -. ScholarBank@NUS Repository. https://doi.org/10.1117/12.774082
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/74374
dc.description.abstractThe damage locating vector (DLV) method based on dynamic response is (a) modified for structural damage detection using normalized cumulative energy (instead of stress) indicator, (b) applied to the case where the number of sensors used is small compared to the structural degrees of freedom, and (c) employed to identify multiple damaged elements of an existing structure. From the measured structural dynamic response at the reference and damaged states, the change in flexibility matrix at sensor locations is formulated based on which the DLV is calculated. The DLV is a set of static load vector which has the property that when applied to the structure at its reference state, no energy is induced in the damaged elements providing the basis to identify damaged elements. The efficiency and robustness of the proposed method are examined using both simulated and experimental data.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.774082
dc.sourceScopus
dc.subjectDamage locating vector
dc.subjectDynamic response
dc.subjectFlexibility matrix
dc.subjectSensor locations
dc.subjectStructural damage detection
dc.typeConference Paper
dc.contributor.departmentCIVIL ENGINEERING
dc.description.doi10.1117/12.774082
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume6932
dc.description.page-
dc.description.codenPSISD
dc.identifier.isiut000257062100062
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