Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.848923
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dc.titleTwo-step dc-term-suppressed phase shifting technique in DSPI
dc.contributor.authorBhaduri, B.
dc.contributor.authorTay, C.J.
dc.contributor.authorQuan, C.
dc.date.accessioned2014-06-19T05:41:46Z
dc.date.available2014-06-19T05:41:46Z
dc.date.issued2010
dc.identifier.citationBhaduri, B., Tay, C.J., Quan, C. (2010). Two-step dc-term-suppressed phase shifting technique in DSPI. Proceedings of SPIE - The International Society for Optical Engineering 7522 : -. ScholarBank@NUS Repository. https://doi.org/10.1117/12.848923
dc.identifier.isbn9780819479129
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/73987
dc.description.abstractDigital speckle pattern interferometry (DSPI) is a tool for making qualitative as well as quantitative measurements of deformation of objects. Temporal and spatial phase shifting techniques have been introduced in DSPI for extracting quantitative deformation data from the system. Temporal phase-shifting technique requires at least three phase shifted intensity patterns for phase measurement. On the other hand, spatial phase shifting technique though require single frame before and after the object deformation, gives low spatial resolution result. In this paper we propose a temporal phase shifting technique that uses only two phase shifted speckle patterns before and after the object deformation by suppressing the dc-term from the intensity pattern either by an averaging technique in spatial domain or low-pass filter operation in the frequency domain. Both the simulation and experimental results are presented to validate the effectiveness of the proposed technique. © 2010 SPIE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.848923
dc.sourceScopus
dc.subjectImage processing
dc.subjectPhase shifting
dc.subjectSpeckle interferometry
dc.subjectWindow fourier transform
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.doi10.1117/12.848923
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume7522
dc.description.page-
dc.description.codenPSISD
dc.identifier.isiut000285572800229
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