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dc.titleInfluence of non-uniform initial porosity distribution on adhesive failure in electronic packages
dc.contributor.authorChew, H.B.
dc.contributor.authorGuo, T.F.
dc.contributor.authorCheng, L.
dc.identifier.citationChew, H.B.,Guo, T.F.,Cheng, L. (2005). Influence of non-uniform initial porosity distribution on adhesive failure in electronic packages. Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005 2 : 549-554. ScholarBank@NUS Repository.
dc.description.abstractAdhesives in electronic packages contain numerous pores and cavities of various size-scales. Moisture diffuses into these voids. During reflow soldering, the simultaneous action of thermal stresses and moisture-induced internal pressure drives both pre-existing and newly nucleated voids to grow and coalesce, causing adhesive failure. In this work, a non-uniform initial porosity distribution in the adhesive is assumed. The entire adhesive is modeled by void-containing cells that incorporate vapor pressure effects on void growth and coalescence through an extended Gurson porous material model. Our computations show that increasing non-uniformity in the adhesive's initial porosity shifts the damage zone from the crack plane to sporadic sites between the crack plane and the film-substrate interfaces. For low porosity adhesives with non-uniform initial porosity distribution, internal pressure promotes extensive damage along the film-substrate interfaces. For high porosity adhesives, the combination of vapor pressure and non-uniform initial porosity distribution induces large-scale voiding throughout the adhesive, causing catastrophic failure. © 2005 IEEE.
dc.typeConference Paper
dc.contributor.departmentMATERIALS SCIENCE
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.sourcetitleProceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
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