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|Title:||Influence of non-uniform initial porosity distribution on adhesive failure in electronic packages||Authors:||Chew, H.B.
|Issue Date:||2005||Citation:||Chew, H.B.,Guo, T.F.,Cheng, L. (2005). Influence of non-uniform initial porosity distribution on adhesive failure in electronic packages. Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005 2 : 549-554. ScholarBank@NUS Repository.||Abstract:||Adhesives in electronic packages contain numerous pores and cavities of various size-scales. Moisture diffuses into these voids. During reflow soldering, the simultaneous action of thermal stresses and moisture-induced internal pressure drives both pre-existing and newly nucleated voids to grow and coalesce, causing adhesive failure. In this work, a non-uniform initial porosity distribution in the adhesive is assumed. The entire adhesive is modeled by void-containing cells that incorporate vapor pressure effects on void growth and coalescence through an extended Gurson porous material model. Our computations show that increasing non-uniformity in the adhesive's initial porosity shifts the damage zone from the crack plane to sporadic sites between the crack plane and the film-substrate interfaces. For low porosity adhesives with non-uniform initial porosity distribution, internal pressure promotes extensive damage along the film-substrate interfaces. For high porosity adhesives, the combination of vapor pressure and non-uniform initial porosity distribution induces large-scale voiding throughout the adhesive, causing catastrophic failure. © 2005 IEEE.||Source Title:||Proceedings of 7th Electronics Packaging Technology Conference, EPTC 2005||URI:||http://scholarbank.nus.edu.sg/handle/10635/73535||ISBN:||0780395786|
|Appears in Collections:||Staff Publications|
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