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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/72952
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dc.titleStudy on LED degradation using CL, EBIC and a two-diode parameter extraction model
dc.contributor.authorXiao, H.
dc.contributor.authorLiu, Y.Y.
dc.contributor.authorPhang, J.C.H.
dc.contributor.authorChan, D.S.H.
dc.contributor.authorChim, W.K.
dc.contributor.authorYan, K.P.
dc.date.accessioned2014-06-19T05:13:51Z
dc.date.available2014-06-19T05:13:51Z
dc.date.issued1999
dc.identifier.citationXiao, H.,Liu, Y.Y.,Phang, J.C.H.,Chan, D.S.H.,Chim, W.K.,Yan, K.P. (1999). Study on LED degradation using CL, EBIC and a two-diode parameter extraction model. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 180-184. ScholarBank@NUS Repository.
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72952
dc.description.abstractLED degradation was investigated using cathodoluminescence (CL), electron-beam-induced current (EBIC) and device parameter extraction using a two-diode model. After electrical stress, the non-radiative recombination current increases, and the electroluminescence (EL) intensity at constant current bias decreases. The average EBIC and CL intensities also decrease. There is a good correlation between CL, EL and EBIC measurements. The two-diode model can reasonably model the LED degradation behaviour.
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL ENGINEERING
dc.description.sourcetitleProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
dc.description.page180-184
dc.description.coden00234
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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