Please use this identifier to cite or link to this item: https://doi.org/10.1109/IEEM.2011.6118176
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dc.titlePerformance-based Burn-in for products sold with warranty
dc.contributor.authorYe, Z.S.
dc.contributor.authorTang, L.C.
dc.contributor.authorXie, M.
dc.date.accessioned2014-06-19T04:54:12Z
dc.date.available2014-06-19T04:54:12Z
dc.date.issued2011
dc.identifier.citationYe, Z.S.,Tang, L.C.,Xie, M. (2011). Performance-based Burn-in for products sold with warranty. IEEE International Conference on Industrial Engineering and Engineering Management : 1544-1548. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IEEM.2011.6118176" target="_blank">https://doi.org/10.1109/IEEM.2011.6118176</a>
dc.identifier.isbn9781457707391
dc.identifier.issn21573611
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72374
dc.description.abstractTo protect users from early failures, manufacturers often use burn-in to screen out weak units and meanwhile providing warranty to customers. Some performance-based burn-in models have been proposed in the literature. However, relations between these indices are not clear. In this study, we look into this problem and reveal the internal relations between these indices. More specifically, we focus on the probability of failure within the warranty period, mean number of failures within the warranty period and the percentile residual life that maximize the warranty period given a specified proportion of field failure. It is found that there are some dual relations between these indices. An illustrative example is used to demonstrate our results. © 2011 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IEEM.2011.6118176
dc.sourceScopus
dc.subjectpercentile of the residual life
dc.subjectProbability of failure
dc.subjectwarranty
dc.typeConference Paper
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/IEEM.2011.6118176
dc.description.sourcetitleIEEE International Conference on Industrial Engineering and Engineering Management
dc.description.page1544-1548
dc.identifier.isiutNOT_IN_WOS
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