Please use this identifier to cite or link to this item: https://doi.org/10.1109/CCA.2010.5611259
DC FieldValue
dc.titleTool wear forecast using Dominant Feature Identification of acoustic emissions
dc.contributor.authorPang, C.K.
dc.contributor.authorZhou, J.-H.
dc.contributor.authorZhong, Z.-W.
dc.contributor.authorLewis, F.L.
dc.date.accessioned2014-06-19T03:30:43Z
dc.date.available2014-06-19T03:30:43Z
dc.date.issued2010
dc.identifier.citationPang, C.K., Zhou, J.-H., Zhong, Z.-W., Lewis, F.L. (2010). Tool wear forecast using Dominant Feature Identification of acoustic emissions. Proceedings of the IEEE International Conference on Control Applications : 1063-1068. ScholarBank@NUS Repository. https://doi.org/10.1109/CCA.2010.5611259
dc.identifier.isbn9781424453627
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/72037
dc.description.abstractIdentification and online prediction of lifetime of cutting tools using cheap sensors is crucial to reduce production costs and down-time in industrial machines. In this paper, we use the acoustic emission from an embedded sensor for computation of features and prediction of tool wear. A reduced feature subset which is optimal in both estimation and clustering least square errors is then selected using a new Dominant Feature Identification (DFI) algorithm to reduce signal processing and number of sensors required. Tool wear is then predicted using an ARMAX model based on the reduced features. Our experimental results on a ball nose cutter in a high speed milling machine show a reduction in 16.83% in mean relative error when compared to other methods proposed in the literature. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/CCA.2010.5611259
dc.sourceScopus
dc.subjectARMAX model
dc.subjectLeast square error (LSE)
dc.subjectPrincipal component analysis (PCA)
dc.subjectPrincipal feature analysis (PFA)
dc.subjectSingular value decomposition (SVD)
dc.subjectTool condition monitoring (TCM)
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/CCA.2010.5611259
dc.description.sourcetitleProceedings of the IEEE International Conference on Control Applications
dc.description.page1063-1068
dc.identifier.isiut000286943900006
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