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https://scholarbank.nus.edu.sg/handle/10635/71958
DC Field | Value | |
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dc.title | Test bench modeling and characterization for fine pitch wafer level packaged devices | |
dc.contributor.author | Jayabalan, J. | |
dc.contributor.author | Mihai, R.D. | |
dc.contributor.author | Tan, J.P.H. | |
dc.contributor.author | Iyer, M.K. | |
dc.contributor.author | Leong, O.B. | |
dc.contributor.author | Seng, L.M. | |
dc.date.accessioned | 2014-06-19T03:29:49Z | |
dc.date.available | 2014-06-19T03:29:49Z | |
dc.date.issued | 2004 | |
dc.identifier.citation | Jayabalan, J.,Mihai, R.D.,Tan, J.P.H.,Iyer, M.K.,Leong, O.B.,Seng, L.M. (2004). Test bench modeling and characterization for fine pitch wafer level packaged devices. Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004 : 502-505. ScholarBank@NUS Repository. | |
dc.identifier.isbn | 0780388216 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/71958 | |
dc.description.abstract | This paper describes an interposer hardware for testing fine pitch wafer level packaged devices. It is built to handle multi-gigahertz signal propagation using 100 micron pitch GSG probes. All the components of the test hardware socket such as the SMA connectors, coplanar transmission lines on the PCB and trampoline mesh have been modeled. A sample chip, without bumps on the pads, has also been measured. The measurement and models demonstrate that the test socket performs at 5 GHz with an insertion loss of about 3dB. © 2004 IEEE. | |
dc.source | Scopus | |
dc.subject | Fine pitch | |
dc.subject | Interconnect modeling | |
dc.subject | Multi-gigahertz test | |
dc.subject | Wafer level package | |
dc.type | Conference Paper | |
dc.contributor.department | MECHANICAL ENGINEERING | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.sourcetitle | Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004 | |
dc.description.page | 502-505 | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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