Please use this identifier to cite or link to this item: https://doi.org/10.1109/IECON.2007.4460236
DC FieldValue
dc.titleSimple analytical models to predict conducted EMI noise in a power electronic converter
dc.contributor.authorMainali, K.
dc.contributor.authorOruganti, R.
dc.date.accessioned2014-06-19T03:27:37Z
dc.date.available2014-06-19T03:27:37Z
dc.date.issued2007
dc.identifier.citationMainali, K., Oruganti, R. (2007). Simple analytical models to predict conducted EMI noise in a power electronic converter. IECON Proceedings (Industrial Electronics Conference) : 1930-1936. ScholarBank@NUS Repository. https://doi.org/10.1109/IECON.2007.4460236
dc.identifier.isbn1424407834
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/71773
dc.description.abstractKnowing the characteristics of the sources and paths involved in the injection of conducted electromagnetic interference (EMI) currents into the input source from a power converter allows one to analyze and improve a converter's electromagnetic compatibility (EMC) performance. In this paper, analytical models to predict the conducted EMI noise generated by a boost power factor correction (PFC) converter are presented. These simple models are based on the noise generation mechanism and the path through which the noise travel. The models require the measurement of high frequency characteristics of the components involved in the noise path. By comparing the predicted noise spectra with the experimentally measured noise spectra, it is verified that the proposed analytical models can be used to reasonably predict the noise generated by the PFC. The proposed models can thus be used to carry out a preliminary design of the EMI filters needed and hence their size and cost even before building and testing the power converter. ©2007 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IECON.2007.4460236
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/IECON.2007.4460236
dc.description.sourcetitleIECON Proceedings (Industrial Electronics Conference)
dc.description.page1930-1936
dc.description.codenIEPRE
dc.identifier.isiut000253451401149
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