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|Title:||Microstructure and magnetic properties of CoZr thin film||Authors:||Yao, X.-F.
|Issue Date:||15-May-2003||Citation:||Yao, X.-F., Wang, J.-P., Zhou, T.-J., Chong, T.C. (2003-05-15). Microstructure and magnetic properties of CoZr thin film. Journal of Applied Physics 93 (10 3) : 8310-8312. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1556273||Abstract:||The microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/70935||ISSN:||00218979||DOI:||10.1063/1.1556273|
|Appears in Collections:||Staff Publications|
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