Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.470667
DC FieldValue
dc.titleLaser applications in integrated circuit packaging
dc.contributor.authorLu, Y.F.
dc.contributor.authorSong, W.D.
dc.contributor.authorRen, Z.M.
dc.contributor.authorAn, C.W.
dc.contributor.authorYe, K.D.
dc.contributor.authorLiu, D.M.
dc.contributor.authorWang, W.J.
dc.contributor.authorHong, M.H.
dc.contributor.authorChong, T.C.
dc.date.accessioned2014-06-19T03:15:52Z
dc.date.available2014-06-19T03:15:52Z
dc.date.issued2002
dc.identifier.citationLu, Y.F., Song, W.D., Ren, Z.M., An, C.W., Ye, K.D., Liu, D.M., Wang, W.J., Hong, M.H., Chong, T.C. (2002). Laser applications in integrated circuit packaging. Proceedings of SPIE - The International Society for Optical Engineering 4637 : 581-591. ScholarBank@NUS Repository. https://doi.org/10.1117/12.470667
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70757
dc.description.abstractLaser processing has large potential in the packaging of integrated circuits (IC). It can be used in many applications such as laser cleaning of IC mold tools, laser deflash to remove mold flash from heat sinks and lead wires of IC packages, laser singulation of BGA (ball grid array) and CSP (chip scale packages), laser reflow of solder ball on GBA, laser marking on packages and on Si wafers. During the implementation of all these applications, laser parameters, material issues, throughput, yield, reliability and monitoring techniques have to be taken into account. Monitoring of laser-induced plasma and laser induced acoustic wave has been used to understand and to control the processes involved in these applications.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.470667
dc.sourceScopus
dc.subjectLaser bumping
dc.subjectLaser deflash
dc.subjectLaser mold cleaning
dc.subjectLaser packaging
dc.subjectLaser reflow
dc.subjectLaser singulation
dc.subjectLaser tagging
dc.typeConference Paper
dc.contributor.departmentDATA STORAGE INSTITUTE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1117/12.470667
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume4637
dc.description.page581-591
dc.description.codenPSISD
dc.identifier.isiut000177443500065
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