Please use this identifier to cite or link to this item:
|Title:||Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering||Authors:||Chin, A.
|Issue Date:||2009||Citation:||Chin, A.,Lin, S.H.,Yang, H.J.,Tsai, C.Y.,Yeh, F.S.,Liao, C.C.,Li, M.-F. (2009). Improved retention and cycling characteristics of MONOS memory using charge-trapping engineering. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 641-645. ScholarBank@NUS Repository. https://doi.org/10.1109/IPFA.2009.5232561||Abstract:||The shallow trap energy in SONOS Charge-Trapping Flash (CTF) is the fundamental challenge for required good retention, especially at elevated temperatures. Although the high temperature retention can be improved by BE-SONOS, this is traded off the slow erase speed. To address these issues, we have fabricated a new Charge-Trapping-Engineered Flash (CTEF) using deep trapping high- dielectric to replace Si3N4. At l500C, the CTEF device shows a large 5.6 V initial memory window and a 3.8 V 10-year extrapolated retention for 4-bits/cell MLC, under very fast 100 sand ±16 V program/erase condition. © 2009 IEEE.||Source Title:||Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA||URI:||http://scholarbank.nus.edu.sg/handle/10635/70557||ISBN:||9781424439102||DOI:||10.1109/IPFA.2009.5232561|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.